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This category only includes cookies that ensures basic functionalities and security features of the website. Necessary cookies are absolutely essential for the website to function properly. For more information about the Avio 500 system, please click here. The Avio 500 system also leverages the cross-platform SyngistixР Р†РІР‚С›РЎС› software, for a seamless transition between AA, ICP, and ICP-MS software.

PlasmaCamР Р†РІР‚С›РЎС› viewing camera: offers continuous color viewing of the plasma, enabling remote diagnostic capabilities and simplifying method development.

PlasmaShearР Р†РІР‚С›РЎС› argon-free interference removal technology: eliminates interferences by removing the cool tail plume of the plasma, delivering maintenance-free, argon-free interference removal.

Universal Data Acquisition: enables simultaneous acquisition of all available wavelengths, helping to reduce or potentially eliminate the need to re-run samples.

Dual View optical system technology: optimizes axial and radial plasma viewing, measuring high and low concentrations in the same run, regardless of wavelength.Flat PlateР Р†РІР‚С›РЎС› plasma technology: generates a robust matrix-tolerant plasma using only half the argon consumed by other ICP systems.Vertical plasma with quick-change torch: delivers matrix flexibility, minimizing sample preparation time.The Avio 500 system combines the following features to deliver optimal performance: simultaneous data acquisition for high sample throughput, the lowest argon consumption of any ICP and extended linear range to reduce sample preparation time while always delivering accurate measurements for challenging samples: Р Р†Р вЂљРЎС™Our new Avio 500 ICP system features technological innovations that will help our customers seamlessly test across key application areas while still keeping up with the demands and challenges of increasing sample loads and lowering the analysis cost.Р Р†Р вЂљРЎСљ Р Р†Р вЂљРЎС™Laboratory professionals continue to face an expansive set of challenges, as regulations increase in complexity and require testing for more elements, resulting in the need for higher sample throughput and a significant increase in the types of analyses they need to perform,Р Р†Р вЂљРЎСљ said Jim Corbett, Executive Vice President and President, Discovery & Analytical Solutions, PerkinElmer.

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